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Title: Real time non-uniformity correction algorithm and implementation in reconfigurable architecture for infra-red imaging systems
Authors: Khare S.
Singh M.
Kumar Kaushik, Brajesh
Published in: Defence Science Journal
Abstract: In modern electro-optical systems, infra-red (IR) imaging system is an essential sensor used for day and night surveillance. In recent years, advancements in IR sensor technology resulted the detectors having smaller pitch, better thermal sensitivity with large format like 640×512, 1024×768 and 1280×1024. Large format IR detectors enables realisation of high resolution compact thermal imager having wide field-of view coverage. However, the performance of these infrared imaging systems gets limited by non uniformity produced by sensing element, which is temporal in nature and present in spatial domain. This non uniformity results the fixed pattern noise, which arises due to variation in gain and offset components of the each pixel of the sensor even when exposed to a uniform scene. This fixed pattern noise limits the temperature resolution capability of the IR imaging system thereby causing the degradation in system performance. Therefore, it is necessary to correct the non-uniformities in real time. In this paper, non uniformity correction algorithm and its implementation in reconfigurable architectures have been presented and results on real time data have been described. © 2019, DESIDOC
Citation: Defence Science Journal (2019), 69(2): 179-184
Issue Date: 2019
Publisher: Defense Scientific Information and Documentation Centre
Keywords: Fixed pattern noise
Non uniformity
Thermal imaging
ISSN: 0011748X
Author Scopus IDs: 16318962500
Author Affiliations: Khare, S., Instruments Research and Development Establishment, Dehradun, 248008, India
Singh, M., Instruments Research and Development Establishment, Dehradun, 248008, India
Kaushik, B.K., Indian Institute of Technology, Roorkee, 247 667, India
Corresponding Author: Khare, S.; Instruments Research and Development EstablishmentIndia; email:
Appears in Collections:Journal Publications [ECE]

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