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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/8354
Title: Geometrically progressive stub loading scheme for miniaturization of transmission line-based components
Authors: Sahoo A.K.
Rawat, Karun
Published in: International Journal of RF and Microwave Computer-Aided Engineering
Abstract: This paper presents a novel slow wave structure (SWS) using geometrically progressive loaded shunt stubs for miniaturization of microstrip lines. It is observed that, compared to the conventional periodically stub loaded SWS, the proposed technique renders further miniaturization of around 20%, theoretically. Apart from that, this technique also helps in suppression of higher pass bands inherently present in SWSs. A detailed analysis of this technique has been carried out with corresponding design scheme. For proof of concept, this miniaturization scheme is applied to a rat-race coupler designed at 2 GHz, where 75% reduction in overall footprint is observed. The simulated and measured results are found to be in good agreement with the proposed theory. © 2020 Wiley Periodicals, Inc.
Citation: International Journal of RF and Microwave Computer-Aided Engineering (2020), 30(5): -
URI: https://doi.org/10.1002/mmce.22140
http://repository.iitr.ac.in/handle/123456789/8354
Issue Date: 2020
Publisher: John Wiley and Sons Inc.
Keywords: geometric progression
harmonics suppression
miniaturization
periodic loading
rat-race coupler
slow wave
ISSN: 10964290
Author Scopus IDs: 57193738037
57000644800
Author Affiliations: Sahoo, A.K., Department of Electronics & Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India
Rawat, K., Department of Electronics & Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India
Corresponding Author: Sahoo, A.K.; Department of Electronics & Communication Engineering, Indian Institute of Technology RoorkeeIndia; email: anujkumar.sahoo@gmail.com
Appears in Collections:Journal Publications [ECE]

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