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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/7952
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dc.contributor.authorKirste R.-
dc.contributor.authorGuo Q.-
dc.contributor.authorDycus J.H.-
dc.contributor.authorFranke A.-
dc.contributor.authorMita S.-
dc.contributor.authorSarkar, Biplab-
dc.contributor.authorReddy P.-
dc.contributor.authorLeBeau J.M.-
dc.contributor.authorCollazo R.-
dc.contributor.authorSitar Z.-
dc.date.accessioned2020-10-09T05:07:20Z-
dc.date.available2020-10-09T05:07:20Z-
dc.date.issued2018-
dc.identifier.citationApplied Physics Express (2018), 11(8): --
dc.identifier.issn18820778-
dc.identifier.urihttps://doi.org/10.7567/APEX.11.082101-
dc.identifier.urihttp://repository.iitr.ac.in/handle/123456789/7952-
dc.description.abstractOptically pumped lasing from AlGaN/AlN multiple quantum wells grown on single-crystalline AlN substrates with lasing thresholds as low as 6 kW/cm2 is demonstrated via the reduction of unintentional point defects in the active region and waveguide, which reduces the non-radiative recombination by 2 orders of magnitude. A higher lasing threshold of 11 kW/cm2 is observed for AlGaN barriers, owing to the reduced localization of electrons and holes in the wells. It is shown that for electrically injected UVC laser diodes, AlGaN barriers are essential. © 2018 The Japan Society of Applied Physics.-
dc.language.isoen_US-
dc.publisherJapan Society of Applied Physics-
dc.relation.ispartofApplied Physics Express-
dc.title6kW/cm2 UVC laser threshold in optically pumped lasers achieved by controlling point defect formation-
dc.typeArticle-
dc.scopusid24450568300-
dc.scopusid57200500288-
dc.scopusid56596702800-
dc.scopusid35731256800-
dc.scopusid8535369100-
dc.scopusid57205868869-
dc.scopusid56985105000-
dc.scopusid16202825900-
dc.scopusid6701729383-
dc.scopusid7004338257-
dc.affiliationKirste, R., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States, Adroit Materials, 2054 Kildaire Farm Road, Suite 205, Cary, NC 27518, United States-
dc.affiliationGuo, Q., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States-
dc.affiliationDycus, J.H., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States-
dc.affiliationFranke, A., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States-
dc.affiliationMita, S., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States, Adroit Materials, 2054 Kildaire Farm Road, Suite 205, Cary, NC 27518, United States-
dc.affiliationSarkar, B., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States-
dc.affiliationReddy, P., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States, Adroit Materials, 2054 Kildaire Farm Road, Suite 205, Cary, NC 27518, United States-
dc.affiliationLeBeau, J.M., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States-
dc.affiliationCollazo, R., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States-
dc.affiliationSitar, Z., Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC 27695-7919, United States, Adroit Materials, 2054 Kildaire Farm Road, Suite 205, Cary, NC 27518, United States-
dc.description.fundingAcknowledgments The authors acknowledge partial financial support from ARL (W56KGU-15-C-0052, W56KGU-14-C-0046), NSF (ECCS-1508854, ECCS-1610992, DMR-1508191, ECCS-1653383), and ARO (W911NF-15-2-0068, W911NF-16-C-0101). Part of this work was performed at the Analytical Instrumentation Facility (AIF) of North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation (award number ECCS-1542015). The AIF is a member of the North Carolina Research Triangle Nanotechnology Network (RTNN), which is a site in the National Nanotechnology Coordinated Infrastructure (NNCI).-
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