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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/7906
Title: Ultrasonic imaging system for flaw characterization
Authors: Verma H.K.
Kumar V.
Anand, Radhey Shyam
Published in: Journal of Microcomputer Applications
Abstract: The ultrasonic imaging system presented here is useful for non-destructive evaluation of metal specimens. Based on the pulse-echo technique, it detects the presence, depth and shape of a flaw or discontinuity in specimens. The surface of the test specimen is scanned by an ultrasonic probe driven by a two-stepper motor assembly configured to get movements along x and y directions independently. An 8-bit microprocessor controls the stepper motors and measures the depth of the flaw at every position of the probe. The data on x and y coordinates of each probed point and depth of flaw at that point (as z coordinate) are stored in a read-write memory in real time. The recorded information is later displayed on a general-purpose CRO. In addition to the description of the system, its advantages, limitations and usage are also given in the paper. © 1992.
Citation: Journal of Microcomputer Applications (1992), 15(1): 79-87
URI: https://doi.org/10.1016/0745-7138(92)90050-F
http://repository.iitr.ac.in/handle/123456789/7906
Issue Date: 1992
ISSN: 7457138
Author Scopus IDs: 57204684351
25646515800
56363331000
Author Affiliations: Verma, H.K., Department of Electrical Engineering, University of Roorkee, Roorkee, 247 667, India
Kumar, V., Department of Electrical Engineering, University of Roorkee, Roorkee, 247 667, India
Anand, R.S., Department of Electrical Engineering, University of Roorkee, Roorkee, 247 667, India
Corresponding Author: Verma, H.K.; Department of Electrical Engineering, University of Roorkee, Roorkee, 247 667, India
Appears in Collections:Journal Publications [EE]

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