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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/7763
Title: Relative Stability Analysis of Perturbed Cart Inverted Pendulum: An Experimental Approach
Authors: Hanwate S.
Hote, Yogesh Vijay
Published in: IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India)
Abstract: In this paper, generalized form of transfer function model of a cart inverted pendulum system is presented. Furthermore, robustness analysis of PID-based cart inverted pendulum using LQR approach and SBL approach are carried out using Krishnamurthi's corollary on Routh criterion by considering variations in cart mass, pendulum length, and also applied force to the cart. Here, the mathematical formula is developed which provides limit for the mass of cart before the pendulum becomes unstable. The most important advantage of the proposed approach is that the analysis is carried using classical approach without using advanced robust control techniques. The results have been verified on a hardware set-up of cart inverted pendulum system. Finally, practical issues have been identified by comparing simulation and hardware results. The results can be expected to be useful in other real-time applications. © 2017, © 2017 IETE.
Citation: IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India) (2018), 35(6): 640-655
URI: https://doi.org/10.1080/02564602.2017.1370396
http://repository.iitr.ac.in/handle/123456789/7763
Issue Date: 2018
Publisher: Taylor and Francis Ltd.
Keywords: Cart inverted pendulum system (CIPS)
Krishnamurthi's approach on Routh criteria
Perturbation
PID controller
Stability margin
ISSN: 2564602
Author Scopus IDs: 56538626500
24173118500
Author Affiliations: Hanwate, S., Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, India
Hote, Y.V., Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, India
Funding Details: The work is carried out in control and robotics lab, Department of Electrical Engineering, and supported by Sponsored Research and Industrial consultancy(SRIC), Indian Institute of Technology Roorkee, India.
Appears in Collections:Journal Publications [EE]

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