Skip navigation
Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/7075
Title: An efficient similarity measure approach for PCB surface defect detection
Authors: Gaidhane V.H.
Hote, Yogesh Vijay
Singh V.
Published in: Pattern Analysis and Applications
Abstract: In this paper, an efficient similarity measure method is proposed for printed circuit board (PCB) surface defect detection. The advantage of the presented approach is that the measurement of similarity between the scene image and the reference image of PCB surface is taken without computing image features such as eigenvalues and eigenvectors. In the proposed approach, a symmetric matrix is calculated using the companion matrices of two compared images. Further, the rank of a symmetric matrix is used as similarity measure metric for defect detection. The numerical value of rank is zero for the defectless images and distinctly large for defective images. It is reliable and well tolerated to local variations and misalignment. The various experiments are carried out on the different PCB images. Moreover, the presented approach is tested in the presence of varying illumination and noise effect. Experimental results have shown the effectiveness of the proposed approach for detecting and locating the local defects in a complicated component-mounted PCB images. © 2017, Springer-Verlag London Ltd.
Citation: Pattern Analysis and Applications (2018), 21(1): 277-289
URI: https://doi.org/10.1007/s10044-017-0640-9
http://repository.iitr.ac.in/handle/123456789/7075
Issue Date: 2018
Publisher: Springer London
Keywords: Companion matrix
Defect detection
Polynomial coefficient
Printed circuit board
Rank
Similarity measure
ISSN: 14337541
Author Scopus IDs: 36782060100
24173118500
55222004300
Author Affiliations: Gaidhane, V.H., Department of Electrical and Electronics Engineering, Birla Institute of Technology and Science, Pilani, Dubai Campus, International Academic City, 345055, Dubai, United Arab Emirates
Hote, Y.V., Department of Electrical Engineering, Indian Institute of Technology (IIT), Roorkee, India
Singh, V., ICE Division, Netaji Subhas Institute of Technology, University of Delhi, New Delhi, India
Corresponding Author: Gaidhane, V.H.; Department of Electrical and Electronics Engineering, Birla Institute of Technology and Science, Pilani, Dubai Campus, International Academic City, 345055, United Arab Emirates; email: vilasgd612@gmail.com
Appears in Collections:Journal Publications [EE]

Files in This Item:
There are no files associated with this item.
Show full item record


Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.