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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/6893
Title: Assessment of Equipment Trip Probability Due to Voltage Sags Based on Fuzzy Possibility Distribution Function
Authors: Behera C.
Reddy G.H.
Chakrapani P.
Goswami A.K.
Gupta, Chandra Prakash
Singh, Girish Kumar
Published in: IEEE Access
Abstract: Assessment of equipment trip is needed for proper estimation of interruption/disruption cost and voltage sag mitigation. The equipment trip depends on the severity of voltage sag and the tolerance of the equipment toward the sag. However, the occurrence of voltage tolerance of an equipment in between the two known bound levels is uncertain in nature. The existing evaluation methods for equipment trip analysis fail to properly assess this uncertain property of voltage tolerance curves. This paper presents a novel approach to assess the equipment trip by handling the uncertainties by using fuzzy probability and possibility distribution. A new method is proposed to transform a rigorously performed statistical data into a fuzzy possibility distribution function, which eliminates the ambiguity that comes with the non-standardized selection of membership function/possibility function. With the proposed method, the statistical data are used to extract the fuzzy probability distribution of voltage sag intensity, which is given by both the magnitude and time duration of voltage sags, while the concept of fuzzy probability is used to calculate the fuzzy trip probability or equipment failure probability. The proposed method is finally applied to estimate the number of trips for six different sensitive equipments connected to two practical Indian distribution systems. © 2013 IEEE.
Citation: IEEE Access (2018), 6(): 76889-76899
URI: https://doi.org/10.1109/ACCESS.2018.2884562
http://repository.iitr.ac.in/handle/123456789/6893
Issue Date: 2018
Publisher: Institute of Electrical and Electronics Engineers Inc.
Keywords: chemical plant
equipment trip
fuzzy probability
sensitivity
tolerance curves
Voltage sag
ISSN: 21693536
Author Scopus IDs: 36713126800
57190608742
57194632990
16542046900
7202352469
57193351909
Author Affiliations: Behera, C., National Institute of Technology at Silchar, Silchar, 788010, India
Reddy, G.H., MVJ College of Engineering, Bengaluru, 560067, India
Chakrapani, P., Assam Power Distribution Company Ltd., Bilasipara, 783348, India
Goswami, A.K., National Institute of Technology at Silchar, Silchar, 788010, India
Gupta, C.P., IIT Roorkee, Roorkee, 247667, India
Singh, G.K., IIT Roorkee, Roorkee, 247667, India
Corresponding Author: Behera, C.; National Institute of Technology at SilcharIndia; email: chinmayabehera77@gmail.com
Appears in Collections:Journal Publications [EE]

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