http://repository.iitr.ac.in/handle/123456789/25976| Title: | Intra-domain periodic defects in monolayer MoS2 |
| Authors: | Roy A. Ghosh R. Rai A. Sanne A. Kim K. Movva H.C.P. Dey R. Pramanik, Tanmoy Chowdhury S. Tutuc E. Banerjee S.K. |
| Published in: | Applied Physics Letters |
| Abstract: | We present an ultra-high vacuum scanning tunneling microscopy study of structural defects in molybdenum disulfide thin films grown on silicon substrates by chemical vapor deposition. A distinctive type of grain boundary periodically arranged inside an isolated triangular domain, along with other inter-domain grain boundaries of various types, is observed. These periodic defects, about 50 nm apart and a few nanometers in width, remain hidden in optical or low-resolution microscopy studies. We report a complex growth mechanism that produces 2D nucleation and spiral growth features that can explain the topography in our films. © 2017 Author(s). |
| Citation: | Applied Physics Letters, 110(20) |
| URI: | https://doi.org/10.1063/1.4983789 http://repository.iitr.ac.in/handle/123456789/25976 |
| Issue Date: | 2017 |
| Publisher: | American Institute of Physics Inc. |
| Keywords: | Chemical vapor deposition Deposition Grain boundaries Scanning tunneling microscopy Topography 2-d nucleations Growth mechanisms Molybdenum disulfide Periodic defects Silicon substrates Spiral growth features Structural defect Triangular domains Defects |
| ISSN: | 36951 |
| Author Scopus IDs: | 35180233300 56582726400 55672148400 55301096500 55953993600 51764085900 57225425824 55938287000 57214071295 6603910934 55566203800 |
| Author Affiliations: | Roy, A., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Ghosh, R., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Rai, A., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Sanne, A., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Kim, K., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Movva, H.C.P., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Dey, R., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Pramanik, T., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Chowdhury, S., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Tutuc, E., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States Banerjee, S.K., Microelectronics Research Center, University of Texas at Austin, Austin, TX 78758, United States |
| Funding Details: | This work was supported in part by NRI SWAN and NSF NNCI. We appreciate technical support from Omicron. |
| Corresponding Author: | Roy, A.; Microelectronics Research Center, United States; email: anupam@austin.utexas.edu |
| Appears in Collections: | Journal Publications [ECE] |
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