http://repository.iitr.ac.in/handle/123456789/24544
Title: | White light modulated forming-free multilevel resistive switching in ZnO:Cu films |
Authors: | Saini M. Kumar M. Mandal R. Mitra, Anirban Som T. |
Published in: | Applied Surface Science |
Abstract: | Optical wavelength controlled forming-free, multilevel resistive switching (RS) is investigated in pulsed laser deposited visible light active 2 wt% Cu-doped ZnO (CZO) thin films. The illumination of wavelength-specific visible light in conjunction with applied voltage modulates the bipolar switching behaviour. Here the control of current compliance is the key to enable the memory device work reversibly at different operating voltage (<10 V) windows. The “set”/“reset” voltages for RS obtained for different wavelengths (in the range of 300–700 nm) appear in between the “set”/“reset” voltages obtained under dark and white light illumination. Light wavelength adds up an extra control parameter in conventional memristor devices for the encryption/decryption of specific information offering better cybersecurity. The RS mechanism is suggested to be filamentary where the formation and the rupturing of conducting filament occur by the migration of defects (e.g. O vacancies and interstitial Zn atoms) under externally applied electric field. This study provides a new insight towards designing visible light-controlled electrically-driven memristive devices, useful for low power operation, for neuromorphic computing. © 2021 Elsevier B.V. |
Citation: | Applied Surface Science, 563 |
URI: | https://doi.org/10.1016/j.apsusc.2021.150271 http://repository.iitr.ac.in/handle/123456789/24544 |
Issue Date: | 2021 |
Publisher: | Elsevier B.V. |
Keywords: | Cu-doped ZnO Current compliance I-V characteristics Resistive switching Visible light |
ISSN: | 1694332 |
Author Scopus IDs: | 57198050929 57222494670 57224354146 57209787039 7003595645 |
Author Affiliations: | Saini, M., SUNAG Laboratory, Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005, Odisha, India, Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400 094, India Kumar, M., Department of Materials Science and Engineering, Ajou University, Suwon, 16499, South Korea Mandal, R., SUNAG Laboratory, Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005, Odisha, India, Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400 094, India Mitra, A., Department of Physics, Indian Institute of Technology, Roorkee 247 667, Uttarakhand, India Som, T., SUNAG Laboratory, Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005, Odisha, India, Homi Bhabha National Institute, Training School Complex, Anushakti Nagar, Mumbai, 400 094, India |
Funding Details: | The authors would like to thank Sanjeev Kumar Srivastava, IIT Kharagpur for help in XPS measurements. |
Corresponding Author: | Som, T.; SUNAG Laboratory, Sachivalaya Marg, India; email: tsom@iopb.res.in |
Appears in Collections: | Journal Publications [PH] |
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