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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/22411
Title: Impact of back plane doping on RF performance of FD-SOI transistor
Authors: Dabhi C.K.
Kushwaha P.
Dasgupta, Avirup
Agarwal H.
Chauhan Y.S.
Published in: 2016 3rd International Conference on Emerging Electronics, ICEE 2016
3rd International Conference on Emerging Electronics, ICEE 2016
Abstract: In this paper, we presents the effect of higher back plane doping on analog figure of merit of fully depleted-silicon on insulator (FD-SOI) MOSFETs at RF frequencies. Procedure for DC and RF parameter extraction at RF frequencies has been discussed. Surface potential based Industry standard BSIM-IMG model for FD-SOI MOSFETs with enhanced gate parasitic network is used for validation of extracted DC and RF parameters such as gate resistance, gate parasitic capacitance, output conductance, transconductance. © 2016 IEEE.
Citation: 2016 3rd International Conference on Emerging Electronics, ICEE 2016 (2017)
URI: https://doi.org/10.1109/ICEmElec.2016.8074584
http://repository.iitr.ac.in/handle/123456789/22411
Issue Date: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Keywords: Back-Plane (BP)
BSIM-IMG
Fully Depleted-silicon on insulator (FD-SOI)
MOSFET
parameter extraction
RF
ISBN: 9.78151E+12
Author Scopus IDs: 57200141180
56149406100
56389226300
53866052200
14029622100
Author Affiliations: Dabhi, C.K., Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India
Kushwaha, P., Electrical Engineering and Computer Science, University of California Berkeley, Berkeley, United States
Dasgupta, A., Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India
Agarwal, H., Electrical Engineering and Computer Science, University of California Berkeley, Berkeley, United States
Chauhan, Y.S., Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India
Funding Details: This work was partially supported by Semiconductor Research Corporation (SRC); Ramanujan fellowship research grant; Council of Scientific and Industrial Research (CSIR, India) and Science and Engineering Research Board (SERB, India). Semiconductor Research Corporation, SRC; Council of Scientific and Industrial Research, CSIR; Science and Engineering Research Board, SERB; Bangladesh Council of Scientific and Industrial Research, BCSIR
Appears in Collections:Conference Publications [ECE]

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