Skip navigation
Please use this identifier to cite or link to this item:
Title: Thickness dependent exchange bias in co-sputter deposited Ni-Mn-Al Heusler alloy hard nanostructured thin films
Authors: Mishra A.
Srivastava S.K.
Kumar A.
Dubey P.
Chauhan S.
Singh A.K.
Kaur, Davinder
ra R.
Published in: Thin Solid Films
Abstract: In the present work thin films of off-stoichiometric Ni-Mn-Al thin films have been successfully deposited on Si substrates. The films have been deposited by DC/RF magnetron sputtering by co-sputtering of the targets of Ni, Mn and Al. The films have been s
Citation: Thin Solid Films, (2014), 142- 146
Issue Date: 2014
Publisher: Elsevier
Keywords: Exchange bias
Heusler alloy
Mechanical property
Spin glass
ISSN: 406090
Author Scopus IDs: 57214672224
Author Affiliations: Mishra, A., Centre for Nanotechnology, Indian Institute of Technology Roorkee, Roorkee, India
Srivastava, S.K., Physics Department, D.B.S. (PG) College, Dehradun, India
Kumar, A., Physics Department, Indian Institute of Technology Roorkee, Roorkee, Indi
Corresponding Author: Chandra, R.; Institute Instrumentation Centre, Indian Institute of Technology RoorkeeIndia
Appears in Collections:Conference Publications [PH]

Files in This Item:
There are no files associated with this item.
Show full item record

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.