http://repository.iitr.ac.in/handle/123456789/18559| Title: | Thickness dependent exchange bias in co-sputter deposited Ni-Mn-Al Heusler alloy hard nanostructured thin films |
| Authors: | Mishra A. Srivastava S.K. Kumar A. Dubey P. Chauhan S. Singh A.K. Kaur, Davinder Ch ra R. |
| Published in: | Thin Solid Films |
| Abstract: | In the present work thin films of off-stoichiometric Ni-Mn-Al thin films have been successfully deposited on Si substrates. The films have been deposited by DC/RF magnetron sputtering by co-sputtering of the targets of Ni, Mn and Al. The films have been s |
| Citation: | Thin Solid Films, (2014), 142- 146 |
| URI: | https://doi.org/10.1016/j.tsf.2014.08.014 http://repository.iitr.ac.in/handle/123456789/18559 |
| Issue Date: | 2014 |
| Publisher: | Elsevier |
| Keywords: | Exchange bias Heusler alloy Mechanical property Spin glass |
| ISSN: | 406090 |
| Author Scopus IDs: | 57214672224 24361388100 57214420311 56478375000 7203036965 56130494500 7004805387 56591551200 |
| Author Affiliations: | Mishra, A., Centre for Nanotechnology, Indian Institute of Technology Roorkee, Roorkee, India Srivastava, S.K., Physics Department, D.B.S. (PG) College, Dehradun, India Kumar, A., Physics Department, Indian Institute of Technology Roorkee, Roorkee, Indi |
| Corresponding Author: | Chandra, R.; Institute Instrumentation Centre, Indian Institute of Technology RoorkeeIndia |
| Appears in Collections: | Conference Publications [PH] |
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