Skip navigation
Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/18518
Full metadata record
DC FieldValueLanguage
dc.contributor.authorNatarajan G.-
dc.contributor.authorO'Reilly L.-
dc.contributor.authorDaniels' S.-
dc.contributor.authorCameron D.C.-
dc.contributor.authorJ.mcnally P.-
dc.contributor.authorLucas O.-
dc.contributor.authorReader A.-
dc.contributor.authorMitra, Anirban-
dc.contributor.authorBradley L.-
dc.contributor.editorMcInerney J.G.-
dc.contributor.editorFarrell G.-
dc.contributor.editorDenieffe D.M.-
dc.contributor.editorBarry L.P.-
dc.contributor.editorGamble H.S.-
dc.contributor.editorHughes P.J.-
dc.contributor.editorMoore A.-
dc.date.accessioned2020-12-03T03:44:06Z-
dc.date.available2020-12-03T03:44:06Z-
dc.date.issued2005-
dc.identifier.citationProceedings of SPIE - The International Society for Optical Engineering, (2005), 364- 369. Dublin-
dc.identifier.issn0277786X-
dc.identifier.urihttps://doi.org/10.1117/12.605100-
dc.identifier.urihttp://repository.iitr.ac.in/handle/123456789/18518-
dc.description.abstractCopper (I) Chloride is a wide band gap semiconductor with great potential for silicon-based optoelectronics due to the fact that is closely lattice matched with silicon. This work examines the deposition of CuCl thin films by magnetron sputtering on silicon and glass substrates. Film structural and morphological properties are studied with X-ray diffraction and atomic force microscopy. Optical absorbance and luminescence spectra of CuCl thin films are analysed in order to study the excitonic features. The influence of deposition process parameters and post annealing on the film properties are also reported.-
dc.description.sponsorshipSPIE Europe;Enterprise Ireland;Science Foundation Ireland;Failte Ireland-
dc.language.isoen_Us-
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineering-
dc.subjectCuCl-
dc.subjectExciton-
dc.subjectLuminescence-
dc.subjectMagnetron sputtering-
dc.subjectXRD-
dc.titleStructural and optoelectronic properties of sputtered copper (I) Chloride-
dc.typeConference Paper-
dc.scopusid7004035980-
dc.scopusid15056648200-
dc.scopusid9042391400-
dc.scopusid26643140300-
dc.scopusid7102317773-
dc.scopusid9044337800-
dc.scopusid7005446774-
dc.scopusid57209787039-
dc.scopusid35756512900-
dc.affiliationNatarajan, G., Nanomaterials Processing Laboratory (NPL), Dublin City University, Dublin-9, Ireland-
dc.affiliationO'Reilly, L., Nanomaterials Processing Laboratory (NPL), Dublin City University, Dublin-9, Ireland-
dc.affiliationDaniels', S., Advanced Surface Technology Research Laboratory (ASTRaL), Mikkeli Research Centre, Lappeenranta University of Technology, PL181, 50101 Mikkeli, Finland-
dc.affiliationCameron, D.C., Advanced Surface Technology Research Laboratory (ASTRaL), Mikkeli Research Centre, Lappeenranta University of Technology, PL181, 50101 Mikkeli, Finland-
dc.affiliationJ.mcnally, P., Nanomaterials Processing Laboratory (NPL), Dublin City University, Dublin-9, Ireland-
dc.affiliationLucas, O., Nanomaterials Processing Laboratory (NPL), Dublin City University, Dublin-9, Ireland-
dc.affiliationReader, A., Innos Ltd., University of Southampton, Highfield, Southampton, SO17 1BJ, United Kingdom-
dc.affiliationMitra, A., Optoelectronics Laboratory, Trinity College, Dublin 2, Ireland-
dc.affiliationBradley, L., Optoelectronics Laboratory, Trinity College, Dublin 2, Ireland-
dc.description.correspondingauthorNatarajan, G.; Nanomaterials Processing Laboratory (NPL), Dublin City University, Dublin-9, Ireland-
dc.identifier.conferencedetailsOpto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks, Dublin, 4-6 April 2005-
Appears in Collections:Conference Publications [PH]

Files in This Item:
There are no files associated with this item.
Show simple item record


Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.