Skip navigation
Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/18245
Title: Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications
Authors: O'Reilly L.
Mitra, Anirban
Lucas F.O.
Natarajan G.
McNally P.J.
Daniels S.
Lankinen A.
Lowney D.
Bradley A.L.
Cameron D.C.
Published in: Journal of Materials Science: Materials in Electronics
Abstract: The use of co-evaporation of ZnCl 2 with CuCl in order to achieve n-type conductivity in CuCl is reported herein. Linear current-voltage (IV) characteristics in the range of ±4 V have been measured using Cu-Au electrical contacts. Room temperature Hall effect measurements show some evidence of a mixed conduction mechanism. On average the samples exhibit n-type conductivity with a bulk electron carrier concentration n ∼1 × 10 16 cm -3 and Hall mobility μ ∼ 29 cm 2v -1 s -1 for a CuCl sample doped with a nominal 3 mole % ZnCl 2. By use of an in situ CaF 2 capping layer, transmission >90% is achieved. At room temperature a strong Z 3 free excitonic emission occurs at ∼385 nm using both photoluminescence and x-ray excited optical luminescence, indicating the high optical quality of the doped material. © Springer Science+Business Media, LLC 2007.
Citation: Journal of Materials Science: Materials in Electronics, (2007), 57- 60
URI: https://doi.org/10.1007/s10854-007-9173-0
http://repository.iitr.ac.in/handle/123456789/18245
Issue Date: 2007
Keywords: Free excitonic emission
Mixed conduction mechanism
N-type conductivity
X-ray excited optical luminescence
Carrier concentration
Copper compounds
Current voltage characteristics
Electric conductivity
Hall effect
Photoluminescence
Zinc compounds
Optoelectronic devices
ISSN: 9574522
Author Scopus IDs: 15056648200
57209787039
10739690200
7004035980
7102317773
8842395600
8930628900
6603551620
35756512900
26643140300
Author Affiliations: O'Reilly, L., Nanomaterials Processing Laboratory, Research Institute for Networks and Communications Engineering (RINCE), Dublin City University, Dublin 9, Ireland
Mitra, A., Nanomaterials Processing Laboratory, Research Institute for Networks and Communications Engineering (RINCE), Dublin City University, Dublin 9, Ireland, Semiconductor Photonics, Physics Department, Trinity College, Dublin 2, Ireland
Lucas, F.O., Nanomaterials Processing Laboratory, Research Institute for Networks and Communications Engineering (RINCE), Dublin City University, Dublin 9, Ireland
Natarajan, G., Nanomaterials Processing Laboratory, National Centre for Plasma Science and Technology (NCPST), Dublin City University, Dublin 9, Ireland
McNally, P.J., Nanomaterials Processing Laboratory, Research Institute for Networks and Communications Engineering (RINCE), Dublin City University, Dublin 9, Ireland
Daniels, S., Nanomaterials Processing Laboratory, National Centre for Plasma Science and Technology (NCPST), Dublin City University, Dublin 9, Ireland
Lankinen, A., Optoelectronics Laboratory, Helsinki University of Technology, TTK, P.O. Box 3500, 02015 Espoo, Finland
Lowney, D., Nanomaterials Processing Laboratory, Research Institute for Networks and Communications Engineering (RINCE), Dublin City University, Dublin 9, Ireland
Bradley, A.L., Semiconductor Photonics, Physics Department, Trinity College, Dublin 2, Ireland
Cameron, D.C., Advanced Surface Technology Research Laboratory (ASTRaL), Lappeenranta University of Technology, P.O. Box 181, Mikkeli 50101, Finland
Funding Details: Acknowledgements This project is supported by the Irish Research Council for Science Engineering and Technology, IRCSET Basic Research Grant SC/2002/7. The author would like to thank Dr. Enda McGlynn of the School of Physical Sciences, Dublin City University for the use of the Hall effect apparatus.
Corresponding Author: O'Reilly, L.; Nanomaterials Processing Laboratory, Research Institute for Networks and Communications Engineering (RINCE), Dublin City University, Dublin 9, Ireland; email: oreillyl@eeng.dcu.ie
Appears in Collections:Conference Publications [PH]

Files in This Item:
There are no files associated with this item.
Show full item record


Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.