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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/17010
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dc.contributor.authorFernandez, Eugene-
dc.contributor.authorPrajapati S.-
dc.contributor.editorTomar A.-
dc.contributor.editorSood Y.R.-
dc.contributor.editorMishra S.-
dc.date.accessioned2020-12-02T14:28:46Z-
dc.date.available2020-12-02T14:28:46Z-
dc.date.issued2019-
dc.identifier.citationProceedings of Lecture Notes in Electrical Engineering, (2019), 1117- 1128-
dc.identifier.isbn9.78981E+12-
dc.identifier.issn18761100-
dc.identifier.urihttps://doi.org/10.1007/978-981-13-6772-4_97-
dc.identifier.urihttp://repository.iitr.ac.in/handle/123456789/17010-
dc.description.abstractThe reliability of a solar photovoltaic (SPV) string can be modified by the use of bypass diodes across affected cells suffering an open circuit due to operational problems. Open-circuit conditions are created by mechanical failure of circuit continuity over a period of time or else due to transient conditions like shadow effects which affect one or more cells in the string. Cells in the string that are enclosed between the ends of the bypass diode, if affected, will be bypassed and the chances of power continuity will be improved. In this paper, we attempt reliability evaluation of a single string of 10 solar PV cells in series using a single bypass diode that can enclose a variable number of cells of the string between its ends. We assume that only one cell is open circuited in the string. Monte Carlo simulations are used to evaluate the LOLP of the string with different bypass diode configurations. The results show that the reliability of power continuity improves as we enclose greater number of PV cells between the bypass diode ends. © 2019, Springer Nature Singapore Pte Ltd.-
dc.language.isoen_US-
dc.publisherSpringer Verlag-
dc.relation.ispartofProceedings of Lecture Notes in Electrical Engineering-
dc.subjectBypass diode-
dc.subjectMonte Carlo simulation-
dc.subjectReliability analysis-
dc.subjectSolar PV modules-
dc.titleImpact of the Positioning of a Single Bypass Diode in a PV String on its Reliability-
dc.typeConference Paper-
dc.scopusid18133259300-
dc.scopusid57209296912-
dc.affiliationFernandez, E., Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand 247667, India-
dc.affiliationPrajapati, S., Department of Electrical Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand 247667, India-
dc.description.correspondingauthorFernandez, E.; Department of Electrical Engineering, Indian Institute of Technology RoorkeeIndia; email: eugenefdz@gmail.com-
dc.identifier.conferencedetailsInternational Conference on Manufacturing, Advanced Computing, Renewable Energy and Communication, MARC 2018, 19-20 July 2018-
Appears in Collections:Conference Publications [EE]

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