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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/16976
Title: Area of vulnerability for prediction of voltage sags by an analytical method in indian distribution systems
Authors: Goswami A.K.
Gupta, Chandra Prakash
Singh, Girish Kumar
Published in: Proceedings of INDICON 2008 IEEE Conference and Exhibition on Control, Communications and Automation
Abstract: This paper proposes an analytical method for voltage sags prediction in distribution systems. The method is based on the ZBus matrix of the distribution network, from which one can immediately build a second matrix that can be called the "Voltage sags matrix" as it compactly provides valuable information about voltage sags throughout the distribution systems. The paper also describes graphical ways to present the effect of a fault on the distribution systems and the area where faults cause severe sags on a given load: affected area and area of vulnerability respectively. An Indian distribution system is used to illustrate the ideas. © 2008 IEEE.
Citation: Proceedings of INDICON 2008 IEEE Conference and Exhibition on Control, Communications and Automation, (2008), 406- 411. Kanpur
URI: https://doi.org/10.1109/indcon.2008.4768758
http://repository.iitr.ac.in/handle/123456789/16976
Issue Date: 2008
Publisher: IEEE Computer Society
Keywords: Area of vulnerability
Bus impedance matrix
Short-circuit analysis
Voltage sag
ISBN: 9.78E+12
Author Scopus IDs: 16542046900
7202352469
57193351909
Author Affiliations: Goswami, A.K., Department of Electrical Engineering, Indian Institute of Technology, Roorkee, Uttarakhand, 247667, India
Gupta, C.P., Department of Electrical Engineering, Indian Institute of Technology, Roorkee, Uttarakhand, 247667, India
Singh, G.K.
Corresponding Author: Goswami, A. K.; Department of Electrical Engineering, Indian Institute of Technology, Roorkee, Uttarakhand, 247667, India
Appears in Collections:Conference Publications [EE]

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