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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/16974
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dc.contributor.authorGoswami A.K.-
dc.contributor.authorGupta, Chandra Prakash-
dc.contributor.authorSingh, Girish Kumar-
dc.date.accessioned2020-12-02T14:28:42Z-
dc.date.available2020-12-02T14:28:42Z-
dc.date.issued2008-
dc.identifier.citationProceedings of IEEE Region 10 Annual International Conference, TENCON, (2008). Hyderabad-
dc.identifier.isbn1424424089; 9781424424085-
dc.identifier.urihttps://doi.org/10.1109/TENCON.2008.4766390-
dc.identifier.urihttp://repository.iitr.ac.in/handle/123456789/16974-
dc.description.abstractIn this paper, analytical expressions for the calculation of voltage sag magnitude due to faults along the line of distribution system are derived. The theoretical background about the residual voltages due to balanced and unbalanced faults at the bus and along the line is presented. A method is described to calculate the number of voltage sags per year. This analytical method is applied for the voltage sag assessment of a real Indian distribution system.-
dc.language.isoen_US-
dc.relation.ispartofProceedings of IEEE Region 10 Annual International Conference, TENCON-
dc.subjectBalanced and unbalanced faults-
dc.subjectStochastic techniques-
dc.subjectVoltage sag-
dc.titleAn analytical approach for stochastic assessment of voltage sags in distribution systems-
dc.typeConference Paper-
dc.scopusid16542046900-
dc.scopusid7202352469-
dc.scopusid57193351909-
dc.affiliationGoswami, A.K., Department of Electrical Engineering, Indian Institute of Technology Roorkee, Uttarakhand, 247667, India-
dc.affiliationGupta, C.P., Department of Electrical Engineering, Indian Institute of Technology Roorkee, Uttarakhand, 247667, India-
dc.affiliationSingh, G.K.,-
dc.description.correspondingauthorGoswami, A. K.; Department of Electrical Engineering, Indian Institute of Technology Roorkee, Uttarakhand, 247667, India; email: arupgdee@iitr.ernet.in-
dc.identifier.conferencedetails2008 IEEE Region 10 Conference, TENCON 2008, Hyderabad, 19-21 November 2008-
Appears in Collections:Conference Publications [EE]

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