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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/16505
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dc.contributor.authorGowrish B.-
dc.contributor.authorRawat, Karun-
dc.contributor.authorBasu A.-
dc.contributor.authorKoul S.K.-
dc.date.accessioned2020-12-02T14:16:38Z-
dc.date.available2020-12-02T14:16:38Z-
dc.date.issued2013-
dc.identifier.citationProceedings of 82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013, (2013). Columbus, OH-
dc.identifier.isbn9.78E+12-
dc.identifier.urihttps://doi.org/10.1109/ARFTG-2.2013.6737361-
dc.identifier.urihttp://repository.iitr.ac.in/handle/123456789/16505-
dc.description.abstractA novel and a robust synthesis technique for designing broad-band matching network is described. Such a matching network will be designed as a band-pass filter that provides broad-band match while absorbing device parasitic within the matching network. This matching network is used in designing a broad-band class AB power amplifier with a flat large signal gain of 12 dB with ±1 dB variation at saturation and output power of 39 dBm over the band from 1.6 GHz to 2.4 GHz with 800 MHz bandwidth. The drain efficiency over 65% is achieved in this entire band of operation corresponding to 40% fractional bandwidth. © 2013 IEEE.-
dc.language.isoen_US-
dc.relation.ispartofProceedings of 82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013-
dc.subjectBroad band power amplifier-
dc.subjectDevice parasitic-
dc.subjectGaN HEMT-
dc.subjectMatching network-
dc.titleBroad-band matching network using band-pass filter with device parasitic absorption-
dc.typeConference Paper-
dc.scopusid56102138700-
dc.scopusid57000644800-
dc.scopusid56023912300-
dc.scopusid55849312100-
dc.affiliationGowrish, B., Centre for Applied Research in Electronics (CARE), New Delhi, Delhi, 110016, India-
dc.affiliationRawat, K., Centre for Applied Research in Electronics (CARE), New Delhi, Delhi, 110016, India-
dc.affiliationBasu, A., Centre for Applied Research in Electronics (CARE), New Delhi, Delhi, 110016, India-
dc.affiliationKoul, S.K., Centre for Applied Research in Electronics (CARE), New Delhi, Delhi, 110016, India-
dc.description.correspondingauthorCentre for Applied Research in Electronics (CARE), New Delhi, Delhi, 110016, India-
dc.identifier.conferencedetails82nd ARFTG Microwave Measurement Conference: Characterization, Modeling, and Design of RF and mm-Wave Devices and Circuits, ARFTG 2013, Columbus, OH, 20-21 November 2013-
Appears in Collections:Conference Publications [ECE]

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