Skip navigation
Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/16251
Full metadata record
DC FieldValueLanguage
dc.contributor.authorKirste R.-
dc.contributor.authorSarkar, Biplab-
dc.contributor.authorKaess F.-
dc.contributor.authorBryan I.-
dc.contributor.authorBryan Z.-
dc.contributor.authorTweedie J.-
dc.contributor.authorCollazo R.-
dc.contributor.authorSitar Z.-
dc.date.accessioned2020-12-02T14:15:54Z-
dc.date.available2020-12-02T14:15:54Z-
dc.date.issued2016-
dc.identifier.citationProceedings of Device Research Conference - Conference Digest, DRC, (2016)-
dc.identifier.isbn9.78E+12-
dc.identifier.issn15483770-
dc.identifier.urihttps://doi.org/10.1109/DRC.2016.7548515-
dc.identifier.urihttp://repository.iitr.ac.in/handle/123456789/16251-
dc.description.abstractDespite the rapid progress in III-nitride-based laser diodes, sub-300 nm UV semiconductors lasers have not been realized yet, mainly due to technical and scientific barriers arising from the lack of proper crystalline substrates and poor understanding of defect control in the wide bandgap semiconductors. In addition to low dislocation density, reduction in non-radiative centers and compensating point defect is required to achieve high internal quantum efficiency (IQE). AlGaN-based technology developed on single crystalline AlN substrates offers a pathway to address these challenges [1, 2]. Recently, UV LEDs emitting at 265 nm with output powers exceeding 80 mW and high reliability [3], as well as low-threshold, optically pumped lasers emitting at wavelengths between 230-280 nm [4,5] have been demonstrated. © 2016 IEEE.-
dc.language.isoen_US-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.ispartofProceedings of Device Research Conference - Conference Digest, DRC-
dc.subjectAluminum nitride-
dc.subjectCrystalline materials-
dc.subjectDefect density-
dc.subjectDefects-
dc.subjectPoint defects-
dc.subjectPumping (laser)-
dc.subjectSemiconductor lasers-
dc.subjectSubstrates-
dc.subjectWide band gap semiconductors-
dc.subjectCrystalline substrates-
dc.subjectDefect control-
dc.subjectHigh reliability-
dc.subjectInternal quantum efficiency-
dc.subjectLow thresholds-
dc.subjectLow-dislocation density-
dc.subjectNonradiative centers-
dc.subjectSingle-crystalline-
dc.subjectOptically pumped lasers-
dc.titleChallenges and breakthroughs in the development of AlGaN-based UVC lasers-
dc.typeConference Paper-
dc.scopusid24450568300-
dc.scopusid57205868869-
dc.scopusid56310683000-
dc.scopusid55507214900-
dc.scopusid55170770300-
dc.scopusid23487136400-
dc.scopusid6701729383-
dc.scopusid7004338257-
dc.affiliationKirste, R., North Carolina State University, Material Science and Engineering Department, Raleigh, NC 27695, United States-
dc.affiliationSarkar, B., Adroit Materials, Inc., 991 Aviation Pkwy, Morrisville, NC 27560, United States-
dc.affiliationKaess, F., Adroit Materials, Inc., 991 Aviation Pkwy, Morrisville, NC 27560, United States-
dc.affiliationBryan, I., Adroit Materials, Inc., 991 Aviation Pkwy, Morrisville, NC 27560, United States-
dc.affiliationBryan, Z., Adroit Materials, Inc., 991 Aviation Pkwy, Morrisville, NC 27560, United States-
dc.affiliationTweedie, J., North Carolina State University, Material Science and Engineering Department, Raleigh, NC 27695, United States-
dc.affiliationCollazo, R., Adroit Materials, Inc., 991 Aviation Pkwy, Morrisville, NC 27560, United States-
dc.affiliationSitar, Z., Adroit Materials, Inc., 991 Aviation Pkwy, Morrisville, NC 27560, United States, North Carolina State University, Material Science and Engineering Department, Raleigh, NC 27695, United States-
dc.identifier.conferencedetails74th Annual Device Research Conference, DRC 2016, 19-22 June 2016-
Appears in Collections:Conference Publications [ECE]

Files in This Item:
There are no files associated with this item.
Show simple item record


Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.