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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/16171
Title: Qualitative optimization of coupling parasitics and driver width in global VLSI interconnects
Authors: Sharma D.K.
Kaushik B.K.
Sharma R.K.
Published in: Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering, LNICST
Abstract: Analyses of the effects of interconnect wires in deep sub-micron technology is of prime importance in the modern era integrated circuits. The performance parameters such as crosstalk noise and delay are fundamentally dependent on interconnects and driver sizing. The coupling parasitics are the primary source of crosstalk. This paper addresses the optimization of coupling parasitics and driver sizing qualitatively for delay and peak noise. For this study, a pair of distributed RLC lines each of 4mm length is considered. These lines are coupled inductively and capacitively. The SPICE waveforms are generated at far end of lines for varying coupling parasitics and width of aggressor driver PMOS while keeping channel width of NMOS half of PMOS. The simulation is carried out at 0.13μm, 1.5 V technology node. Both the cases of simultaneous switching of inputs i.e in-phase and out-of-phase are taken into consideration. © Institute for Computer Sciences, Social Informatics and Telecommunications Engineering 2012.
Citation: Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering, LNICST, (2012), 1- 10. Bangalore
URI: https://doi.org/10.1007/978-3-642-27308-7_1
http://repository.iitr.ac.in/handle/123456789/16171
Issue Date: 2012
Keywords: Coupling parasitics
Crosstalk noise
Delay
Driver width
Optimization
ISBN: 9.78E+12
ISSN: 18678211
Author Scopus IDs: 55581078400
57021830600
56591002200
Author Affiliations: Sharma, D.K., Department of ECE, Meerut Institute of Engineering and Technology, Meerut, UP, India
Kaushik, B.K., Dept. of Electronics and Computer Engg, Indian Institute of Technology, Roorkee, India
Sharma, R.K., Department of ECE, National Institute of Technology, Kurukshetra, Haryana, India
Corresponding Author: Department of ECE, Meerut Institute of Engineering and Technology, Meerut, UP, India
Appears in Collections:Conference Publications [ECE]

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