Skip navigation
Please use this identifier to cite or link to this item:
Title: Analysis of On Chip Optical Source Vertical Cavity Surface Emitting Laser (VCSEL)
Authors: Dahiya S.
Kumar S.
Kumar Kaushik, Brajesh
Tyagi V.
Mishra A.
Basu A.
Published in: Proceedings of Advances in Intelligent Systems and Computing
Abstract: The major developments in semiconductor laser technology, i.e., Vertical Cavity Surface Emitting Lasers (VCSELs), really revolutionized the field of semiconductor lasers and play a pivotal role in every walk of life such as science and technology, research and development, consumer and industrial environment, medical, military, surveillance, telecommunication, and a host of other applications. Although the development of lasers is pertinent to each other because of dependence on Distributed Bragg Reflector (DBR) mirrors, the devices under reference are normally supposed to be the most appropriate semiconductor lasers for their evident plentiful significances and applications. In modern age, the importance of VCSELs is reflected in fact that they have become the second largest production among all types of semiconductor lasers due to intrinsic structure features of array formation, coherent emission with small beam divergence, large output power, low-threshold operations, high modulation bandwidths, etc., tuned by electrical and temperature variations. In the present investigation, the electrical and optical characteristics of the state-of-the-art long-wavelength VCSEL at 1310, nm emission is analyzed with different apertures such as 20 and 12, µm. The authors observed that if the oxide aperture of the same device is reduced 20 to 12, µm, it obtained the incremental in the carrier and photon density rates and subsequently reduces the emitted power, threshold current, and gain of the devices. The present communication discusses the history, present status, and an exposure of some state-of-the-art performances with optimized results of VCSELs. © Springer Nature Singapore Pte Ltd. 2018.
Citation: Proceedings of Advances in Intelligent Systems and Computing, (2018), 65- 77
Issue Date: 2018
Publisher: Springer Verlag
Keywords: Characterization and results
Device layout
Significance and applications
ISBN: 9.79E+12
ISSN: 21945357
Author Scopus IDs: 57191880010
Author Affiliations: Dahiya, S., Department of Electronics and Communication Engineering, BPSMV, Sonipat, Khanpur-Kalan, India
Kumar, S., Department of Electronics and Communication Engineering, UIET, MDU, Rohtak, India
Kaushik, B.K., Department of Electronics and Communication Engineering, IIT, Roorkee, India
Corresponding Author: Dahiya, S.; Department of Electronics and Communication Engineering, BPSMV, Sonipat, India; email:
Appears in Collections:Conference Publications [ECE]

Files in This Item:
There are no files associated with this item.
Show full item record

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.