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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/13991
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dc.contributor.authorArya M.-
dc.contributor.authorRanjan M.-
dc.contributor.authorBhatnagar M.-
dc.contributor.authorNath R.-
dc.contributor.authorMitra, Anirban-
dc.date.accessioned2020-10-15T12:36:19Z-
dc.date.available2020-10-15T12:36:19Z-
dc.date.issued2018-
dc.identifier.citationPlasmonics (2018), 13(2): 373-383-
dc.identifier.issn15571955-
dc.identifier.urihttps://doi.org/10.1007/s11468-017-0521-5-
dc.identifier.urihttp://repository.iitr.ac.in/handle/123456789/13991-
dc.description.abstractEffective permittivity of closely spaced random nanoparticles supported by a substrate has been calculated using a modified Yamaguchi’s model (MYM) which involves the exact expression of a local field outside a metal nanoparticle (NP) along with the effective-medium approach. Pulsed laser deposition has been used to deposit silver nanoisland films on SiO2 substrates. In-plane and out-of-plane plasmonic responses have been calculated using MYM for various filling fractions and the results are compared with those obtained from spectroscopic ellipsometry. Distinct features of out-of-plane and in-plane plasmons are observed with an spectroscopic ellipsometer and their behavior is supported by the present theoretical investigation. The comparison of the effective dielectric constants of the films obtained from ellipsometry data with those calculated using MYM shows uniaxial optical anisotropy in our case. The calculated morphological parameters (filling fraction, aspect ratio, and average particle size) using MYM are also found to be consistent with those obtained from FESEM images. © 2017, Springer Science+Business Media New York.-
dc.language.isoen_Us-
dc.publisherSpringer New York LLC-
dc.relation.ispartofPlasmonics-
dc.subjectAnalytical modeling-
dc.subjectEllipsometry-
dc.subjectPlasmonics-
dc.subjectPulsed laser deposition-
dc.titleIn-Plane and Out-of-Plane Plasmons in Random Silver Nanoisland Films-
dc.typeArticle-
dc.scopusid57190933490-
dc.scopusid23398228400-
dc.scopusid56524143500-
dc.scopusid57190939047-
dc.scopusid57209787039-
dc.affiliationArya, M., Department of Physics, Indian Institute of Technology, Roorkee, Uttarakhand 247667, India-
dc.affiliationRanjan, M., FCIPT, Institute of Plasma Research, Sector-25, Gandhinagar, Gujarat, India-
dc.affiliationBhatnagar, M., FCIPT, Institute of Plasma Research, Sector-25, Gandhinagar, Gujarat, India-
dc.affiliationNath, R., Department of Physics, Indian Institute of Technology, Roorkee, Uttarakhand 247667, India-
dc.affiliationMitra, A., Department of Physics, Indian Institute of Technology, Roorkee, Uttarakhand 247667, India-
dc.description.correspondingauthorArya, M.; Department of Physics, Indian Institute of TechnologyIndia; email: aryamahima@gmail.com-
Appears in Collections:Journal Publications [PH]

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