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Please use this identifier to cite or link to this item: http://repository.iitr.ac.in/handle/123456789/13757
Title: Electron impact excitation of tin
Authors: Sharma, Lalita
Bharti S.
Srivastava, Rajesh
Published in: European Physical Journal D
Abstract: Abstract: We study the electron impact excitation of the fine-structure levels of the ground state configuration 5p2 to the excited states of the configuration 5p6s in tin atom. These calculations have been carried out in the jj coupling scheme using the relativistic distorted-wave method. Results for differential cross section are reported at incident electron energies 20, 50, 80 and 100 eV while integrated cross sections are presented in the incident electron energy range of 5 to 100 eV. Graphical abstract: [Figure not available: see fulltext.]. © 2017, EDP Sciences, SIF, Springer-Verlag Berlin Heidelberg.
Citation: European Physical Journal D (2017), 71(5): -
URI: https://doi.org/10.1140/epjd/e2017-70640-x
http://repository.iitr.ac.in/handle/123456789/13757
Issue Date: 2017
Publisher: Springer New York LLC
ISSN: 14346060
Author Scopus IDs: 14046198100
57194378171
7401868829
Author Affiliations: Sharma, L., Indian Institute of Technology Roorkee, Roorkee, 247667, India
Bharti, S., Indian Institute of Technology Roorkee, Roorkee, 247667, India
Srivastava, R., Indian Institute of Technology Roorkee, Roorkee, 247667, India
Corresponding Author: Sharma, L.; Indian Institute of Technology RoorkeeIndia; email: lalitfph@iitr.ac.in
Appears in Collections:Journal Publications [PH]

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