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Showing results 107 to 109 of 109 < previous 
Issue DateTitleAuthor(s)
2005X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloyKapoor K.; Lahiri, Debrupa; Batra I.S.; Rao S.V.R.; Sanyal T.
2004X-ray diffraction line profile analysis for defect study in Zr-2·5% Nb materialKapoor K.; Lahiri, Debrupa; Rao S.V.R.; Sanyal T.; Kashyap B.P.
2002X-ray measurement of near surface residual stress in textured cold-worked stress-relieved Zr-2.5%Nb pressure tube materialKapoor K.; Lahiri, Debrupa; Padmaprabu C.; Sanyal T.