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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
2020Anisotropic magnetoelectric functionality of ferromagnetic shape memory alloy heterostructures for MEMS magnetic sensorsKumar A.; Pawar S.; Pey A.; Dutta S.; Kaur, Davinder
2019Binder free and high performance of sputtered tungsten nitride thin film electrode for supercapacitor devicePrakash R.; Kumar A.; Pandey A.; Kaur D.
2016Dislocation density investigation on MOCVD-grown GaN epitaxial layers using wet and dry defect selective etchingPey A.; Yadav B.S.; Rao D.V.S.; Kaur, Davinder; Kapoor A.K.
2018Electrical and structural characteristics of sputtered c-oriented AlN thin films on Si (100) and Si (110) substratesPey A.; Kaushik J.; Dutta S.; Kapoor A.K.; Kaur, Davinder
2018Growth and Comparison of Residual Stress of AlN Films on Silicon (100), (110) and (111) SubstratesPey A.; Dutta S.; Prakash R.; Raman R.; Kapoor A.K.; Kaur, Davinder
2016Growth and evolution of residual stress of AlN films on silicon (100) waferPey A.; Dutta S.; Prakash R.; Dalal S.; Raman R.; Kapoor A.K.; Kaur, Davinder
2018Growth assessment and scrutinize dielectric reliability of c-axis oriented insulating AlN thin films in MIM structures for microelectronics applicationsPawar S.; Singh K.; Sharma S.; Pandey A.; Dutta S.; Kaur D.
2016Improved electrical transport properties in high quality nanocrystalline silicon carbide (nc-SiC) thin films for microelectronic applicationsSingh N.; Singh K.; Pandey A.; Kaur, Davinder