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Browsing by Author Das B.P.

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Showing results 1 to 20 of 21  next >
Issue DateTitleAuthor(s)
2017A 10T subthreshold SRAM cell with minimal bitline switching for ultra-low power applicationsSwaati; Das B.P.; Kaushik B.K.; Dasgupta S.; Singh V.
2016A metastability immune timing error masking flip-flop for dynamic variation toleranceSannena G.; Das B.P.
2019An optimal device sizing for a performance-driven and area-efficient subthreshold cell library for IoT applicationsSharma P.; Jain P.; Das B.P.
2017Area and power-efficient timing error predictor for dynamic voltage and frequency scaling applicationSannena G.; Das B.P.
2014Building trusted ICs using split fabricationVaidyanathan K.; Das B.P.; Sumbul E.; Liu R.; Pileggi L.
2014Detecting reliability attacks during split fabrication using test-only BEOL stackVaidyanathan K.; Das B.P.; Pileggi L.
2014Frequency-independent warning detection sequential for dynamic voltage and frequency scaling in ASICsDas B.P.; Onodera H.
2018Low Overhead Warning Flip-Flop Based on Charge Sharing for Timing Slack MonitoringSannena G.; Das B.P.
2018Metastability immune and area efficient error masking flip-flop for timing error resilient designsSannena G.; Das B.P.
2016New phenomenological approach for modeling fatigue life of asphalt mixesSaboo N.; Das B.P.; Kumar P.
2014On-chip measurement of rise/fall gate delay using reconfigurable ring oscillatorDas B.P.; Onodera H.
2019On-chip threshold voltage variability detector targeting supply of ring oscillator for characterizing local device mismatchJain P.; Das B.P.
2019On-Chip Threshold Voltage Variability Estimation Using Reconfigurable Ring OscillatorJain P.; Das B.P.
2019Reducing the impact of local load variation on the DUT in a process detector using a supply controlled ring oscillatorJain P.; Das B.P.
2008Voltage and temperature scalable gate delay and slew models including intra-gate variationsDas B.P.; Janakiraman V.; Amrutur B.; Jamadagni H.S.; Arvind N.V.
2008Voltage and temperature scalable standard cell leakage models based on stacks for statistical leakage characterizationViraraghavan J.; Das B.P.; Amrutur B.
2011Voltage and temperature-aware SSTA using neural network delay modelDas B.P.; Amrutur B.; Jamadagni H.S.; Arvind N.V.; Visvanathan V.
2010Warning prediction sequential for transient error preventionDas B.P.; Onodera H.
2008Within-die gate delay variability measurement using re-configurable ring oscillatorDas B.P.; Amrutur B.; Jamadagni H.S.; Arvind N.V.; Visvanathan V.
2009Within-Die gate delay variability measurement using reconfigurable ring oscillatorDas B.P.; Amrutur B.; Jamadagni H.S.; Arvind N.V.; Visvanathan V.