| Issue Date | Title | Author(s) |
| 2019 | A New Aspect of Saturation Phenomenon in FinFETs and Its Implication on Analog Circuits | Banchhor S.; Kumar K.D.; Dwivedi A.; Anand, Bulusu |
| 2019 | A New Aspect of Saturation Phenomenon in FinFETs and Its Implication on Analog Circuits | Banchhor S.; Kumar K.D.; Dwivedi A.; Anand, Bulusu |
| 2021 | A new physical insight into the zero-temperature coefficient with self-heating in silicon-on-insulator fin field-effect transistors | Banchhor S.; Chauhan N.; Anand, Bulusu |
| 2021 | A new physical insight into the zero-temperature coefficient with self-heating in silicon-on-insulator fin field-effect transistors | Banchhor S.; Chauhan N.; Anand, Bulusu |
| 2021 | A physical insight into variation aware minimum v DDfor deep subthreshold operation of FinFET | Yadav S.; Chauhan N.; Tyagi S.; Sharma A.; Banchhor S.; Joshi R.; Pratap R.; Anand, Bulusu |
| 2021 | A physical insight into variation aware minimum v DDfor deep subthreshold operation of FinFET | Yadav S.; Chauhan N.; Tyagi S.; Sharma A.; Banchhor S.; Joshi R.; Pratap R.; Anand, Bulusu |
| 2020 | Demonstration of a novel tunnel FET with channel sandwiched by drain | Bagga N.; Chauhan N.; Banchhor S.; Gupta D.; Dasgupta, Sudeb |
| 2021 | Gain Stabilization Methodology for FinFET Amplifiers Considering Self-Heating Effect | Banchhor S.; Chauhan N.; Doneria A.; Anand, Bulusu |
| 2021 | Gain Stabilization Methodology for FinFET Amplifiers Considering Self-Heating Effect | Banchhor S.; Chauhan N.; Doneria A.; Anand, Bulusu |
| 2017 | Improvement in analog performance in a 16-nm FinFET technology using a systematic study of saturation phenomenon | Dwivedi A.; Banchhor S.; Singhai A.; Anand, Bulusu |
| 2017 | Improvement in analog performance in a 16-nm FinFET technology using a systematic study of saturation phenomenon | Dwivedi A.; Banchhor S.; Singhai A.; Anand, Bulusu |
| 2021 | Investigation of Trap-Induced Performance Degradation and Restriction on Higher Ferroelectric Thickness in Negative Capacitance FDSOI FET | Garg C.; Chauhan N.; Sharma A.; Banchhor S.; Doneria A.; Dasgupta, Sudeb; Anand, Bulusu |
| 2021 | Investigation of Trap-Induced Performance Degradation and Restriction on Higher Ferroelectric Thickness in Negative Capacitance FDSOI FET | Garg C.; Chauhan N.; Sharma A.; Banchhor S.; Doneria A.; Dasgupta S.; Anand, Bulusu |
