Issue Date | Title | Author(s) |
---|---|---|
2019 | Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node | Kushwaha P.; Agarwal H.; Lin Y.-K.; Dasgupta, Avirup; Kao M.-Y.; Lu Y.; Yue Y.; Chen X.; Wang J.; Sy W.; Yang F.; Chidambaram P.R.C.; Salahuddin S.; Hu C. |